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Accuracy of Xpert Clostridium difficile assay for the diagnosis of Clostridium difficile infection: A meta analysis

    作者

    Bai, YY;Sun, XR;Jin, Y;Wang, YL;Li, J

    作者单位

    [Bai, Yuanyuan; Jin, Yan; Wang, Yueling] Shandong Univ, Dept Clin Lab, Shandong Prov Hosp, Jinan, Shandong, Peoples R China.;-;[Sun, Xiaorong; Li, Juan] Jinan Women & Childrens Hlth Hosp, Dept Pathol, Jinan, Shandong, Peoples R China.

    摘要

    Background;-;There is an urgent need for rapid and accurate microbiological diagnostic assay for detection of Clostridium difficile infection (CDI). We assessed the diagnostic accuracy of the Xpert Clostridium difficile assay (Xpert CD) for the diagnosis of CDI.;-;Methods;-;We searched PubMed, EMBASE, and Cochrane Library databases to identify studies according to predetermined criteria. STATA 13.0 software was used to analyze the tests for sensitivity, specificity, positive likelihood ratio, negative likelihood ratio, diagnostic odds ratio, and area under the summary receiver operating characteristic curves (AUC). QUADAS- 2 was used to assess the quality of included studies with RevMan 5.2. Heterogeneity in accuracy measures was tested with Spearman correlation coefficient and Chi-square.;-;Results;-;A total of 22 studies were included in the meta-analysis. The pooled sensitivity (95% confidence intervals [CI]) was 0.97 (0.95-0.99) and specificity was 0.95 (0.94-0.96). The AUC was 0.99 (0.97-0.99). Significant heterogeneity was observed when we pooled most of the accuracy measures of selected studies.;-;Conclusions;-;The Xpert CD assay is a useful diagnostic tool with high sensitivity and specificity in diagnosing toxigenic CDI, and this method has excellent usability due to its rapidity and simplicity.

    关键词

    BD MAX CDIFF; ILLUMIGENE C. DIFFICILE; STOOL SPECIMENS; TESTING ALGORITHMS; TOXIGENIC CULTURE; ABBOTT M2000; STRAIN TYPE; IMPACT; TOXIN; AMPLIFICATION
基本信息

  • 所属机构:检验

    归属医师: 金炎 王月玲 白媛媛

    PMID:29016644

    UT:000412601800025

    刊名:PLOS ONE

    年,卷(期):2017年12卷10期

    DOI:10.1371/journal.pone.0185891

    附件: pdf

    收录:   SCIE