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Pioglitazone Improves Cognitive Function via Increasing Insulin Sensitivity and Strengthening Antioxidant Defense System in Fructose-Drinking Insulin Resistance Rats

    作者

    Yin, QQ;Pei, JJ;Xu, S;Luo, DZ;Dong, SQ;Sun, MH;You, L;Sun, ZJ;Liu, XP

    作者单位

    [Yin, Qing-Qing; Luo, Ding-Zhen; Dong, Si-Qing; Sun, Meng-Han; Liu, Xue-Ping] Shandong Univ, Prov Hosp, Dept Senile Neurol, Jinan 250100, Shandong, Peoples R China.;-;[Pei, Jin-Jing] Karolinska Inst, Dept KI Alzheimer Dis Res Ctr, Stockholm, Sweden.;-;[Xu, Song; Sun, Zhi-Jian; Liu, Xue-Ping] Shandong Univ, Prov Hosp, Dept Antiageing, Jinan 250100, Shandong, Peoples R China.;-;[You, Li] Shandong Univ, Dept Cent Lab, Prov Hosp, Jinan 250100, Shandong, Peoples R China.

    摘要

    Insulin resistance (IR) links Alzheimer's disease (AD) with oxidative damage, cholinergic deficit, and cognitive impairment. Peroxisome proliferator-activated receptor gamma (PPAR gamma) agonist pioglitazone previously used to treat type 2 diabetes mellitus (T2DM) has also been demonstrated to be effective in anti-inflammatory reaction and anti-oxidative stress in the animal models of AD and other neuroinflammatory diseases. Here, we investigated the effect of pioglitazone on learning and memory impairment and the molecular events that may cause it in fructose-drinking insulin resistance rats. We found that long-term fructose-drinking causes insulin resistance, oxidative stress, down-regulated activity of cholinergic system, and cognitive deficit, which could be ameliorated by pioglitazone administration. The results from the present study provide experimental evidence for using pioglitazone in the treatment of brain damage caused by insulin resistance.

    关键词

    TYPE-2 DIABETES-MELLITUS; OXIDATIVE STRESS; ALZHEIMERS-DISEASE; INTRACEREBROVENTRICULAR STREPTOZOTOCIN; ACETYLCHOLINESTERASE ACTIVITY; LIPID-PEROXIDATION; MEMORY IMPAIRMENT; PPAR-GAMMA; BRAIN; MODEL
基本信息

  • 所属机构:保健神经内科

    归属医师: 罗鼎真 殷青青 董泗芹 徐松 刘雪平 游力 孙志坚

    PMID:23527159

    UT:000317562600069

    刊名:PLOS ONE

    年,卷(期):2013年8卷3期

    DOI:10.1371/journal.pone.0059313

    附件: pdf

    收录:   SCIE